本量測系統主要建構在Klippel 系統下,搭配雷射與標準麥克風,透過Klippel 系統中的LPM獲得揚聲器(微型揚聲器)在小振幅的振動條件下的電-機-聲參數,也就是所謂的TS參數;同時間,並可利用此系統進行傳統TS參數之增加容積法與增加質量法的量測。
可獲得的特性與參數有: 線性參數、小振幅參數、TS參數
[This measurement system is mainly used to obtain the TS parameters of loudspeaker including mechanical, electrical, and acoustical part. The novel method with laser, as well as conventional Added Mass and Added Volume method, can be applied in this system.]
Environment | B303 | |
Software | Klippel system-LPM module | |
Hardware | Power Amplfiier | MT-1000 |
Analyzer | Klippel-DA2 | |
Microphone+Preamplifier | MK250,MV210 (optional) | |
Calibrator | 4000 | |
Laser | LK-G30 (optional) | |
Others | Professional Driver Stand |
NT$ 5,000/hr